——
Potential difference-induced degradation Test system for PID Crystal Silicon Modules
Applicable standards:
IEC 62804-1-1 2021, IEC 63209VR 2019
Power supply and data acquisition:
DC stabilized power supply: 10 channels, independent output, independent monitoring, each channel can separately control the positive and negative direction of the voltage
Voltage range:-2000V to + 2000V
Voltage resolution: 1V
Voltage accuracy: 1000V, 1500V, 2000V continuous output within 500h voltage fluctuation ≤ 2%
Connection method:
The component frame is grounded, and the connector is connected to the high voltage end after short connection; the negative pressure test and positive pressure recovery only need to switch, and there is no need to change the connection mode.
Voltage application mode: 10 power supplies are independent of each other and can output different polarities and different voltage values at the same time.
Voltage accuracy: ±3% (see CNAS-CL01-A021:2018)
Voltage tolerance: 0.5% (see IEC 62804-1-1RO 2020)
Current measurement range: 0~1mA resolution: 0.01 μ A (specified in IEC 62804-1-1, version 2020)
Collection interval: 5 minutes or less (software settings)
Safety protection function: overcurrent alarm, overvoltage alarm, overtemperature alarm, communication interface with environmental test chamber
Standard configuration:
Component frame connector, component MC4 connector: 10 sets
PID test special high voltage wire: 10 sets
Industrial control computer, electric control cabinet, PLC control system
Chinese software function:
The leakage current is recorded in real time, and the interval time of data acquisition can be set by software.
Data export format: EXCEL
Test condition
PID has two test conditions to choose from, two temperature / humidity combinations:
Method ARV 85 °C / 85%
Method BRV 72 °C / 95%
Test duration: 240h
Potential difference-induced degradation Test system for PID Crystal Silicon Modules
Applicable standards:
IEC 62804-1-1 2021, IEC 63209VR 2019
Power supply and data acquisition:
DC stabilized power supply: 10 channels, independent output, independent monitoring, each channel can separately control the positive and negative direction of the voltage
Voltage range:-2000V to + 2000V
Voltage resolution: 1V
Voltage accuracy: 1000V, 1500V, 2000V continuous output within 500h voltage fluctuation ≤ 2%
Connection method:
The component frame is grounded, and the connector is connected to the high voltage end after short connection; the negative pressure test and positive pressure recovery only need to switch, and there is no need to change the connection mode.
Voltage application mode: 10 power supplies are independent of each other and can output different polarities and different voltage values at the same time.
Voltage accuracy: ±3% (see CNAS-CL01-A021:2018)
Voltage tolerance: 0.5% (see IEC 62804-1-1RO 2020)
Current measurement range: 0~1mA resolution: 0.01 μ A (specified in IEC 62804-1-1, version 2020)
Collection interval: 5 minutes or less (software settings)
Safety protection function: overcurrent alarm, overvoltage alarm, overtemperature alarm, communication interface with environmental test chamber
Standard configuration:
Component frame connector, component MC4 connector: 10 sets
PID test special high voltage wire: 10 sets
Industrial control computer, electric control cabinet, PLC control system
Chinese software function:
The leakage current is recorded in real time, and the interval time of data acquisition can be set by software.
Data export format: EXCEL
Test condition
PID has two test conditions to choose from, two temperature / humidity combinations:
Method ARV 85 °C / 85%
Method BRV 72 °C / 95%
Test duration: 240h
